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File:Fib sample preparation tem.jpg

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Summary

Description
English: Images of the same thin film sample at different scales, showing the geometry of a transmission electron microscopy sample made using a focused ion beam. The two leftmost images are from the focused ion beam used to make the transmission electron microscopy sample, imaged using secondary electrons. The rightmost figure is a scanning transmission electron microscopy image, showing the atomic structure of the sample.
Date
Source Own work
Author Magnunor

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Captions

Image showing different scales of a tranmission electron microscopy sample prepared using focused ion beam liftout.

Items portrayed in this file

depicts

22 October 2019

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Date/TimeThumbnailDimensionsUserComment
current16:08, 22 October 2019Thumbnail for version as of 16:08, 22 October 20192,400 × 800 (827 KB)MagnunorUser created page with UploadWizard

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